HITACHI SEM
CBSET’s pathology facilities house specimen preparation equipment and a state-of-the-art Hitachi S-3400N-II fully automated, variable-pressure scanning electron microscope (SEM). SEM tissue specimen preparation equipment installed and maintained at CBSET includes two Quorum E3100 critical point dryers, and a Pd-Au sputter coater for preparation of tissue and medical device specimens for secondary electron (SE) imaging under high vacuum. Variable pressure mode and back-scattered electron imaging (BSE) may be utilized for uncoated, vacuum-sensitive specimens.
Hitachi S-3400N-II SEM specifications:
- Resolution — 3.0nm High Vacuum Mode; f 4.0nm Variable Pressure Mode
- Detectors — SE and BSE (solid state, TV rate observation)
- Chamber — Accommodates up to 10-inch diameter specimens
- Stage — Fully eucentric, 5 axis computer controlled motorized stage
- Electron Gun — Variable Quad Bias Circuitry with SE Accelerator Plate
- Automation — Full automation including "no touch" objective aperture alignment
- Vacuum — Turbo Molecular Pump (TMP)
CBSET has fully trained and certified personnel to process, image, and analyze and report data obtained from studies utilizing SEM. The high-resolution imaging allows the investigator to clearly examine, assess and characterize device structural integrity, as well as the tissue response surrounding the device.
